Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge

Wenjing Rao, Chengmo Yang, Ramesh Karri, Alex Orailoglu. Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge. IEEE Computer, 44(2):46-53, 2011. [doi]

Authors

Wenjing Rao

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Chengmo Yang

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Ramesh Karri

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Alex Orailoglu

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