Wenjing Rao, Chengmo Yang, Ramesh Karri, Alex Orailoglu. Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge. IEEE Computer, 44(2):46-53, 2011. [doi]
@article{RaoYKO11,
title = {Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge},
author = {Wenjing Rao and Chengmo Yang and Ramesh Karri and Alex Orailoglu},
year = {2011},
doi = {10.1109/MC.2011.1},
url = {http://dx.doi.org/10.1109/MC.2011.1},
tags = {reliability},
researchr = {https://researchr.org/publication/RaoYKO11},
cites = {0},
citedby = {0},
journal = {IEEE Computer},
volume = {44},
number = {2},
pages = {46-53},
}