Muhammad Rashid Rasheed, Sonya Coleman, Bryan Gardiner, Philip J. Vance, Cormac McAteer, Khoi Nguyen. An EfficientNet-Based Transfer Learning System for Defect Classification in Manufacturing. In 22nd IEEE International Conference on Industrial Informatics, INDIN 2024, Beijing, China, August 18-20, 2024. pages 1-7, IEEE, 2024. [doi]
Abstract is missing.