On the Effect of Instrumentation on Test Flakiness

Shawn Rasheed, Jens Dietrich 0001, Amjed Tahir. On the Effect of Instrumentation on Test Flakiness. In IEEE/ACM International Conference on Automation of Software Test, AST 2023, Melbourne, Australia, May 15-16, 2023. pages 123-127, IEEE, 2023. [doi]

Authors

Shawn Rasheed

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Jens Dietrich 0001

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Amjed Tahir

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