Shawn Rasheed, Jens Dietrich 0001, Amjed Tahir. On the Effect of Instrumentation on Test Flakiness. In IEEE/ACM International Conference on Automation of Software Test, AST 2023, Melbourne, Australia, May 15-16, 2023. pages 123-127, IEEE, 2023. [doi]
@inproceedings{RasheedDT23,
title = {On the Effect of Instrumentation on Test Flakiness},
author = {Shawn Rasheed and Jens Dietrich 0001 and Amjed Tahir},
year = {2023},
doi = {10.1109/AST58925.2023.00016},
url = {https://doi.org/10.1109/AST58925.2023.00016},
researchr = {https://researchr.org/publication/RasheedDT23},
cites = {0},
citedby = {0},
pages = {123-127},
booktitle = {IEEE/ACM International Conference on Automation of Software Test, AST 2023, Melbourne, Australia, May 15-16, 2023},
publisher = {IEEE},
isbn = {979-8-3503-2402-0},
}