Effect of semiconductor devices' output parasitic capacitance on zero-current clamping phenomenon in PWM-VSI drives

Dayan B. Rathnayake, Sunil G. Abeyratne. Effect of semiconductor devices' output parasitic capacitance on zero-current clamping phenomenon in PWM-VSI drives. In 10th IEEE International Conference on Industrial and Information Systems, ICIIS 2015, Peradeniya, Sri Lanka, December 18-20, 2015. pages 446-451, IEEE, 2015. [doi]

Abstract

Abstract is missing.