R. M. C. B. Ratnayake, Craig Hicks, M. A. Akbari. A SVM Based Method to Detect Color Shift Defects in IC Packages. In Proceedings of the IAPR Conference on Machine Vision Applications (IAPR MVA 2007), May 16-18, 2007, Tokyo, Japan. pages 138-141, 2007. [doi]
Abstract is missing.