A novel reseeding mechanism for pseudo-random testing of VLSI circuits

Jiann-Chyi Rau, Ying-Fu Ho, Po-Han Wu. A novel reseeding mechanism for pseudo-random testing of VLSI circuits. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 2979-2982, IEEE, 2005. [doi]

Authors

Jiann-Chyi Rau

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Ying-Fu Ho

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Po-Han Wu

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