A Scan-Based Lower-Power Testing Architecture for Modern Circuits

Jiann-Chyi Rau, Jia-Xiang Wang. A Scan-Based Lower-Power Testing Architecture for Modern Circuits. In International Symposium on Intelligent Signal Processing and Communication Systems, ISPACS 2021, Hualien City, Taiwan, November 16-19, 2021. pages 1-2, IEEE, 2021. [doi]

Authors

Jiann-Chyi Rau

This author has not been identified. Look up 'Jiann-Chyi Rau' in Google

Jia-Xiang Wang

This author has not been identified. Look up 'Jia-Xiang Wang' in Google