Thomas W. Rauber, Francisco de Assis Boldt, Flávio Miguel Varejão, Marcos Pellegrini Ribeiro. Feature models and condition visualization for rotating machinery fault diagnosis. In 20th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2013, Abu Dhabi, December 8-11, 2013. pages 265-268, IEEE, 2013. [doi]
Abstract is missing.