Thiago H. Rausch, Wesley Grignani, Luigi Dilillo, Douglas R. Melo. Reliability and Performance Evaluation of a Fault-Tolerant MPSoC Interconnection Architecture. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2025, Barcelona, Spain, October 21-23, 2025. pages 1-4, IEEE, 2025. [doi]
Abstract is missing.