Thiago H. Rausch, Wesley Grignani, Luigi Dilillo, Douglas R. Melo. Resilience Analysis of a Fault-Tolerant MPSoC Interconnection Architecture Under SEU Fault Injection. In 27th IEEE Latin American Test Symposium, LATS 2026, Florianópolis, Brazil, March 17-20, 2026. pages 1-6, IEEE, 2026. [doi]
Abstract is missing.