Michael J. Rausch, William H. Sanders. Stacked Metamodels for Sensitivity Analysis and Uncertainty Quantification of AMI Models. In 2020 IEEE International Conference on Communications, Control, and Computing Technologies for Smart Grids, SmartGridComm 2020, Tempe, AZ, USA, November 11-13, 2020. pages 1-7, IEEE, 2020. [doi]
Abstract is missing.