Circuit-level characterization and loss modeling of SiC-based power electronic converters

Lakshmi Ravi, Eric L. Severson, Saurabh Tewari, Ned Mohan. Circuit-level characterization and loss modeling of SiC-based power electronic converters. In IECON 2014 - 40th Annual Conference of the IEEE Industrial Electronics Society, Dallas, TX, USA, October 29 - Nov. 1, 2014. pages 1291-1297, IEEE, 2014. [doi]

Abstract

Abstract is missing.