Sandip Ray, Swarup Bhunia, Yier Jin, Mark Tehranipoor. Security validation in IoT space. In 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016. pages 1, IEEE Computer Society, 2016. [doi]
@inproceedings{RayBJT16,
title = {Security validation in IoT space},
author = {Sandip Ray and Swarup Bhunia and Yier Jin and Mark Tehranipoor},
year = {2016},
doi = {10.1109/VTS.2016.7477288},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2016.7477288},
researchr = {https://researchr.org/publication/RayBJT16},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-8454-4},
}