Iyad Rayane, Jaime Velasco-Medina, Michael Nicolaidis. A Digital BIST for Operational Amplifiers Embedded in Mixed-Signal Circuits. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 304-310, IEEE Computer Society, 1999. [doi]
Abstract is missing.