A dynamic calibration scheme for on-chip process and temperature variations

Mina Raymond, Maged Ghoneima, Yehea I. Ismail. A dynamic calibration scheme for on-chip process and temperature variations. In International Symposium on Circuits and Systems (ISCAS 2011), May 15-19 2011, Rio de Janeiro, Brazil. pages 2047-2050, IEEE, 2011. [doi]

Authors

Mina Raymond

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Maged Ghoneima

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Yehea I. Ismail

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