Alin Razafindraibe, Philippe Maurine. A Model of DPA Syndrome and Its Application to the Identification of Leaking Gates. In Nadine Azémard, Lars J. Svensson, editors, Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation, 17th International Workshop, PATMOS 2007, Gothenburg, Sweden, September 3-5, 2007, Proceedings. Volume 4644 of Lecture Notes in Computer Science, pages 394-403, Springer, 2007. [doi]
Abstract is missing.