Jeff Rearick. Too much delay fault coverage is a bad thing. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 624-633, IEEE Computer Society, 2001.
@inproceedings{Rearick01,
title = {Too much delay fault coverage is a bad thing},
author = {Jeff Rearick},
year = {2001},
tags = {coverage},
researchr = {https://researchr.org/publication/Rearick01},
cites = {0},
citedby = {0},
pages = {624-633},
booktitle = {Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001},
publisher = {IEEE Computer Society},
isbn = {0-7803-7169-0},
}