Jeff Rearick. Buying time for the stuck-at fault model. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 1167, IEEE Computer Society, 1997. [doi]
@inproceedings{Rearick97a,
title = {Buying time for the stuck-at fault model},
author = {Jeff Rearick},
year = {1997},
url = {http://www.computer.org/proceedings/itc/5093/50931167.pdf},
tags = {meta-model, Meta-Environment},
researchr = {https://researchr.org/publication/Rearick97a},
cites = {0},
citedby = {0},
pages = {1167},
booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
publisher = {IEEE Computer Society},
isbn = {0-7803-4209-7},
}