Julian Reck, Thomas Bach, Jan Stoess. A Multidimensional Analysis of Bug Density in SAP HANA. In Satish Chandra 0001, Kelly Blincoe, Paolo Tonella, editors, Proceedings of the 31st ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/FSE 2023, San Francisco, CA, USA, December 3-9, 2023. pages 1997-2007, ACM, 2023. [doi]
Abstract is missing.