Fault Modeling and Pattern-Sensitivity Testing for a Multilevel DRAM - researchr publication authors

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Michael Redeker, Bruce F. Cockburn, Duncan G. Elliott, Yunan Xiang, Sue Ann Ung. Fault Modeling and Pattern-Sensitivity Testing for a Multilevel DRAM. In 10th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2002), 10-12 July 2002, Isle of Bendor, France. pages 117-122, IEEE Computer Society, 2002. [doi]

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