An Improved Technique to Assess AC Performance of a Submicron GaN HEMTs - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Saif-Ur Rehman, Hafiz Fuad Usman, Umer Farooq Ahmed, M. Asif, Soo Young Shin. An Improved Technique to Assess AC Performance of a Submicron GaN HEMTs. In 2019 International Conference on Information and Communication Technology Convergence, ICTC 2019, Jeju Island, Korea (South), October 16-18, 2019. pages 1104-1109, IEEE, 2019. [doi]

This author has not been identified. Look up 'Saif-Ur Rehman' in GoogleThis author has not been identified. Look up 'Hafiz Fuad Usman' in GoogleThis author has not been identified. Look up 'Umer Farooq Ahmed' in GoogleThis author has not been identified. Look up 'M. Asif' in GoogleThis author has not been identified. Look up 'Soo Young Shin' in Google

runs on WebDSL