Saif-Ur Rehman, Hafiz Fuad Usman, Umer Farooq Ahmed, M. Asif, Soo Young Shin. An Improved Technique to Assess AC Performance of a Submicron GaN HEMTs. In 2019 International Conference on Information and Communication Technology Convergence, ICTC 2019, Jeju Island, Korea (South), October 16-18, 2019. pages 1104-1109, IEEE, 2019. [doi]
Abstract is missing.