Waveform relaxation for transient simulation of two-dimensional MOS devices

Mark W. Reichelt, Jacob K. White, Jonathan Allen. Waveform relaxation for transient simulation of two-dimensional MOS devices. In 1989 IEEE International Conference on Computer-Aided Design, ICCAD 1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical Papers. pages 412-415, IEEE, 1989. [doi]

Authors

Mark W. Reichelt

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Jacob K. White

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Jonathan Allen

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