Development of high resolution magnetic field measurements for switching arc diagnosis of low-voltage switchgear - researchr publication authors

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Christian Reil, Hans-Peter Schmidt. Development of high resolution magnetic field measurements for switching arc diagnosis of low-voltage switchgear. In IEEE AFRICON 2017, Cape Town, South Africa, September 18-20, 2017. pages 1185-1188, IEEE, 2017. [doi]

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