Christian Reil, Hans-Peter Schmidt. Development of high resolution magnetic field measurements for switching arc diagnosis of low-voltage switchgear. In IEEE AFRICON 2017, Cape Town, South Africa, September 18-20, 2017. pages 1185-1188, IEEE, 2017. [doi]
@inproceedings{ReilS17,
title = {Development of high resolution magnetic field measurements for switching arc diagnosis of low-voltage switchgear},
author = {Christian Reil and Hans-Peter Schmidt},
year = {2017},
doi = {10.1109/AFRCON.2017.8095650},
url = {https://doi.org/10.1109/AFRCON.2017.8095650},
researchr = {https://researchr.org/publication/ReilS17},
cites = {0},
citedby = {0},
pages = {1185-1188},
booktitle = {IEEE AFRICON 2017, Cape Town, South Africa, September 18-20, 2017},
publisher = {IEEE},
isbn = {978-1-5386-2775-4},
}