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Automated Test-Trace Inspection for Microcontroller Binary Code

Thomas Reinbacher, Jörg Brauer, Daniel Schachinger, Andreas Steininger, Stefan Kowalewski. Automated Test-Trace Inspection for Microcontroller Binary Code. In Sarfraz Khurshid, Koushik Sen, editors, Runtime Verification - Second International Conference, RV 2011, San Francisco, CA, USA, September 27-30, 2011, Revised Selected Papers. Volume 7186 of Lecture Notes in Computer Science, pages 239-244, Springer, 2011. [doi]

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Thomas Reinbacher

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Jörg Brauer

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Daniel Schachinger

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Andreas Steininger

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Stefan Kowalewski

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