Thomas Reinbacher, Jörg Brauer, Daniel Schachinger, Andreas Steininger, Stefan Kowalewski. Automated Test-Trace Inspection for Microcontroller Binary Code. In Sarfraz Khurshid, Koushik Sen, editors, Runtime Verification - Second International Conference, RV 2011, San Francisco, CA, USA, September 27-30, 2011, Revised Selected Papers. Volume 7186 of Lecture Notes in Computer Science, pages 239-244, Springer, 2011. [doi]
@inproceedings{ReinbacherBSSK11,
title = {Automated Test-Trace Inspection for Microcontroller Binary Code},
author = {Thomas Reinbacher and Jörg Brauer and Daniel Schachinger and Andreas Steininger and Stefan Kowalewski},
year = {2011},
doi = {10.1007/978-3-642-29860-8_18},
url = {http://dx.doi.org/10.1007/978-3-642-29860-8_18},
researchr = {https://researchr.org/publication/ReinbacherBSSK11},
cites = {0},
citedby = {0},
pages = {239-244},
booktitle = {Runtime Verification - Second International Conference, RV 2011, San Francisco, CA, USA, September 27-30, 2011, Revised Selected Papers},
editor = {Sarfraz Khurshid and Koushik Sen},
volume = {7186},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-29859-2},
}