On-line Boundary-Scan Testing in Service of Extended Products

Ilka Reis, Peter Collins, Marc van Houcke. On-line Boundary-Scan Testing in Service of Extended Products. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-10, IEEE, 2006. [doi]

Authors

Ilka Reis

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Peter Collins

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Marc van Houcke

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