Konstantinos Rematas, Tobias Ritschel, Mario Fritz, Efstratios Gavves, Tinne Tuytelaars. Deep Reflectance Maps. In 2016 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016, Las Vegas, NV, USA, June 27-30, 2016. pages 4508-4516, IEEE Computer Society, 2016. [doi]
Abstract is missing.