Kari Remes, Antti Latomäki, Tapio Fabritius. Flexible Electronics Non-Destructive Uniformity Characterization by Synchronized Thermography. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019, Auckland, New Zealand, May 20-23, 2019. pages 1-5, IEEE, 2019. [doi]
Abstract is missing.