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Beyond the Deep Metric Learning: Enhance the Cross-Modal Matching with Adversarial Discriminative Domain Regularization

Li Ren, Kai Li 0005, Liqiang Wang, Kien A. Hua. Beyond the Deep Metric Learning: Enhance the Cross-Modal Matching with Adversarial Discriminative Domain Regularization. In 25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021. pages 10165-10172, IEEE, 2020. [doi]

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