Yi Ren, A.-L. He, S.-T. Shi, G. Guo, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Bharat L. Bhuva. Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser. J. Electronic Testing, 30(1):149-154, 2014. [doi]
@article{RenHSGCWWVB14,
title = {Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser},
author = {Yi Ren and A.-L. He and S.-T. Shi and G. Guo and Li Chen and Shi-Jie Wen and Richard Wong and N. W. van Vonno and Bharat L. Bhuva},
year = {2014},
doi = {10.1007/s10836-013-5431-7},
url = {http://dx.doi.org/10.1007/s10836-013-5431-7},
researchr = {https://researchr.org/publication/RenHSGCWWVB14},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {30},
number = {1},
pages = {149-154},
}