Haoxing Ren, Mary P. Kusko, Victor N. Kravets, Rona Yaari. Low cost test point insertion without using extra registers for high performance design. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-8, IEEE, 2009. [doi]
@inproceedings{RenKKY09,
title = {Low cost test point insertion without using extra registers for high performance design},
author = {Haoxing Ren and Mary P. Kusko and Victor N. Kravets and Rona Yaari},
year = {2009},
doi = {10.1109/TEST.2009.5355747},
url = {http://dx.doi.org/10.1109/TEST.2009.5355747},
researchr = {https://researchr.org/publication/RenKKY09},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009},
editor = {Gordon W. Roberts and Bill Eklow},
publisher = {IEEE},
isbn = {978-1-4244-4868-5},
}