Dongmei Ren, Imad Rahal, William Perrizo, Kirk Scott. A vertical distance-based outlier detection method with local pruning. In David A. Grossman, Luis Gravano, ChengXiang Zhai, Otthein Herzog, David A. Evans, editors, Proceedings of the 2004 ACM CIKM International Conference on Information and Knowledge Management, Washington, DC, USA, November 8-13, 2004. pages 279-284, ACM, 2004. [doi]
Abstract is missing.