Jiajun Ren, Jiu Xiong, Jin Liu. ADC Quantization with Overlapping Metastability Zones and Dual Reference Calibration. In Hoi Lee, Randall L. Geiger, editors, 62nd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2019, Dallas, TX, USA, August 4-7, 2019. pages 896-899, IEEE, 2019. [doi]
Abstract is missing.