Leijie Ren, Mingshun Yang, Yirou Liu, Jiali Han. Quality Defect Recognition Method Based on Variable Precision Rough Set and Deep Belief Network. In 4th International Conference on Artificial Intelligence and Advanced Manufacturing, AIAM 2022, Hamburg, Germany, October 7-9, 2022. pages 612-615, IEEE, 2022. [doi]
Abstract is missing.