Márta Rencz. New possibilities in the thermal evaluation, offered by transient testing. Microelectronics Journal, 34(3):171-177, 2003. [doi]
@article{Rencz03,
title = {New possibilities in the thermal evaluation, offered by transient testing},
author = {Márta Rencz},
year = {2003},
doi = {10.1016/S0026-2692(02)00185-4},
url = {http://dx.doi.org/10.1016/S0026-2692(02)00185-4},
tags = {testing},
researchr = {https://researchr.org/publication/Rencz03},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {34},
number = {3},
pages = {171-177},
}