Silja Renooij, Linda C. van der Gaag. Evidence and Scenario Sensitivities in Naive Bayesian Classifiers. In Milan Studený, Jirí Vomlel, editors, Third European Workshop on Probabilistic Graphical Models, 12-15 September 2006, Prague, Czech Republic. Electronic Proceedings. pages 255-262, 2006. [doi]
@inproceedings{RenooijG06,
title = {Evidence and Scenario Sensitivities in Naive Bayesian Classifiers},
author = {Silja Renooij and Linda C. van der Gaag},
year = {2006},
url = {http://www.utia.cas.cz/files/mtr/pgm06/23_paper.pdf},
tags = {C++},
researchr = {https://researchr.org/publication/RenooijG06},
cites = {0},
citedby = {0},
pages = {255-262},
booktitle = {Third European Workshop on Probabilistic Graphical Models, 12-15 September 2006, Prague, Czech Republic. Electronic Proceedings},
editor = {Milan Studený and Jirí Vomlel},
}