Michel Renovell, Florence Azaïs, J-C. Bodin, Yves Bertrand. Combining Functional and Structural Approaches for Switched-Current Circuit Testing. J. Electronic Testing, 16(3):259-267, 2000. [doi]
@article{RenovellABB00,
title = {Combining Functional and Structural Approaches for Switched-Current Circuit Testing},
author = {Michel Renovell and Florence Azaïs and J-C. Bodin and Yves Bertrand},
year = {2000},
doi = {10.1023/A:1008347516954},
url = {http://dx.doi.org/10.1023/A:1008347516954},
tags = {testing, C++, systematic-approach},
researchr = {https://researchr.org/publication/RenovellABB00},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {16},
number = {3},
pages = {259-267},
}