Matteo Sonza Reorda, Massimo Violante. A New Approach to the Analysis of Single Event Transients in VLSI Circuits. J. Electronic Testing, 20(5):511-521, 2004. [doi]
@article{ReordaV04:1,
title = {A New Approach to the Analysis of Single Event Transients in VLSI Circuits},
author = {Matteo Sonza Reorda and Massimo Violante},
year = {2004},
doi = {10.1023/B:JETT.0000042515.67579.c1},
url = {http://dx.doi.org/10.1023/B:JETT.0000042515.67579.c1},
tags = {analysis, systematic-approach},
researchr = {https://researchr.org/publication/ReordaV04%3A1},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {20},
number = {5},
pages = {511-521},
}