David Resnick. Embedded Test for a new Memory-Card Architecture. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 875-882, IEEE, 2004. [doi]
@inproceedings{Resnick04:0,
title = {Embedded Test for a new Memory-Card Architecture},
author = {David Resnick},
year = {2004},
doi = {10.1109/ITC.2004.69},
url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.69},
tags = {architecture, testing},
researchr = {https://researchr.org/publication/Resnick04%3A0},
cites = {0},
citedby = {0},
pages = {875-882},
booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA},
publisher = {IEEE},
isbn = {0-7803-8581-0},
}