A Connected Devices Testbed for Insight Generation in Support of UK Industry

Katharina Reusch, Andrew Hill, Deylan Bailey, Thomas Christy, David Moss. A Connected Devices Testbed for Insight Generation in Support of UK Industry. In IEEE International Conference on Sensing, Communication and Networking, SECON 2016 Workshops, London, United Kingdom, June 27, 2016. pages 1-6, IEEE, 2016. [doi]

Abstract

Abstract is missing.