Electro Optical Terahertz Pulse Reflectometry, a non destructive technique to localize defects on various type of package

Antoine Reverdy, M. Marchetti, A. Fudoli, A. Pagani, V. Goubier, M. Cason, J. Alton, M. Igarashi, G. Gibbons. Electro Optical Terahertz Pulse Reflectometry, a non destructive technique to localize defects on various type of package. Microelectronics Reliability, 54(9-10):2075-2080, 2014. [doi]

Abstract

Abstract is missing.