Robustness improvement of VDMOS transistors in Bipolar/CMOS/DMOS technology

Yannick Rey-Tauriac, O. de Sagazan, M. Taurin, Olivier Bonnaud. Robustness improvement of VDMOS transistors in Bipolar/CMOS/DMOS technology. Microelectronics Reliability, 43(9-11):1865-1869, 2003. [doi]

Abstract

Abstract is missing.