Ahmad Rezaei, Johannes Richter, Johannes Nau, Detlef Streitferdt, Michael Kirchhoff. Transparency and Traceability for AI-Based Defect Detection in PCB Production. In Dana Simian, Laura Florentina Stoica, editors, Modelling and Development of Intelligent Systems - 8th International Conference, MDIS 2022, Sibiu, Romania, October 28-30, 2022, Revised Selected Papers. Volume 1761 of Communications in Computer and Information Science, pages 54-72, Springer, 2022. [doi]
Abstract is missing.