Michael Richter, Krishnendu Chakrabarty. Test pin count reduction for NoC-based Test delivery in multicore SOCs. In Wolfgang Rosenstiel, Lothar Thiele, editors, 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012. pages 787-792, IEEE, 2012. [doi]
@inproceedings{RichterC12, title = {Test pin count reduction for NoC-based Test delivery in multicore SOCs}, author = {Michael Richter and Krishnendu Chakrabarty}, year = {2012}, url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6176601}, researchr = {https://researchr.org/publication/RichterC12}, cites = {0}, citedby = {0}, pages = {787-792}, booktitle = {2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012}, editor = {Wolfgang Rosenstiel and Lothar Thiele}, publisher = {IEEE}, isbn = {978-1-4577-2145-8}, }