Test pin count reduction for NoC-based Test delivery in multicore SOCs

Michael Richter, Krishnendu Chakrabarty. Test pin count reduction for NoC-based Test delivery in multicore SOCs. In Wolfgang Rosenstiel, Lothar Thiele, editors, 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012. pages 787-792, IEEE, 2012. [doi]

Abstract

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