Michael Richter, Klaus Oberländer, Michael Gössel. New Linear SEC-DED Codes with Reduced Triple Bit Error Miscorrection Probability. In 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece. pages 37-42, IEEE, 2008. [doi]
@inproceedings{RichterOG08,
title = {New Linear SEC-DED Codes with Reduced Triple Bit Error Miscorrection Probability},
author = {Michael Richter and Klaus Oberländer and Michael Gössel},
year = {2008},
doi = {10.1109/IOLTS.2008.27},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2008.27},
researchr = {https://researchr.org/publication/RichterOG08},
cites = {0},
citedby = {0},
pages = {37-42},
booktitle = {14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece},
publisher = {IEEE},
isbn = {978-0-7695-3264-6},
}